Fretting Damage

Fretting is a mechanical condition that occurs when two contacting parts have relative movements of small amplitude, typically in the order of tens of microns. In industrial applications, it is usually caused by vibrations or oscillating loads in one of the contacting components. Once present, it can generate different types of localized damage, such as cracks, wear, and oxidation, which can lead to failures or reduce the service life of the components.

(a) Detail of the contact configuration in a _fretting_ test of an Inconel 690 tube against two pieces of type 304L stainless steel. (b) Wear in the tube observed by optical microscopy. (c) Cracks in the tube observed by scanning electron microscopy. In both cases the damage was originated in the same _fretting_ conditions but at different number of cycles.

A significant part of the work in this area has focused on the design and manufacture of various experimental devices. Using these devices, most of which are mounted on a servohydraulic test machine, controlled and repeatable experiments have been performed. To characterize the damage in the materials resulting from these tests, different techniques have been used, including optical microscopy, scanning electron microscopy (SEM), transmission electron microscopy (TEM), and optical interferometry profilometry.

Setup of a device for fretting tests on tubes mounted on a servohydraulic test machine.

Human Resources Training in the Field

In this area, there is a PhD thesis in progress, and as of 2021, 5 professionals have been trained within the Metals Physics Division: a Doctor of Engineering Sciences, two Masters of Engineering, a Mechanical Engineer, and an Electromechanical Engineer.

Although the topic is mainly focused on steam generator tubes, fretting studies within the division have also extended to shape memory materials and hip prosthesis components.

techniques and associated equipment:

  • Mechanical testing with servohydraulic machines and devices developed in the division.
  • Optical interferometry profilometry.
  • Optical microscopy.
  • Scanning Electron Microscopy (SEM).
  • Transmission Electron Microscopy (TEM).
  • working on this topic